Kyoritsu 6016 Manual do Utilizador descarregar pdf (Página 41)

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However it is also good practice to consider even more stringent trip time limits, by following

the standard values of trip times at I△n defined by IEC 61009 (EN 61009) and IEC 61008

(EN 61008). These trip time limits are listed in the table below for IΔn and 5I△n:

Type of RCD IΔn 5IΔn

General(G)

300ms

max allowed value

40ms

max allowed value

Selective(S)

500ms

max allowed value

150ms

max allowed value

130ms

min allowed value

50ms

min allowed value

Examples of instrument connections

Practical example of 3-phase + neutral RCD test in a TT system.

Practical example of single phase RCD test in a TN system.

×1

30 mA

230V

L-PE

UL50

PHASE : 0

50.0Hz

L-PE

L-N

Fig.35

×1

30 mA

230V

L-PE

UL50

PHASE : 0°

50.0Hz

L-PE

L-N

Fig.36

1 2 ... 36 37 38 39 40 41 42 43 44 45 46 ... 59 60

KEW 6016 1
CONTENTS 2
21. CASE AND STRAP ASSEMBLY 2
1. SAFE TESTING 4
2. INSTRUMENT LAYOUT 6
3. Accessories 8
4. FEATURES 9
5. Specification 11
Configuration 19
Back Light : 19
NULL OFF 20
Measuring 21
7.2 2Ω Buzzer ( ) function 22
8. INSULATION TESTS 23
9. LOOP/ PSC/PFC 29
ATT : ON 35
10. RCD TESTS 40
11. EARTH TESTS 46
12. PHASE ROTATION TESTS 48
13. VOLTS 49
14. TOUCH PAD 49
15. BACK LIGHT 49
16. MEMORY FUNCTION 50
Fig.48-4 51
Fig.48-5 51
Fig.48-6 51
Fig.49-1 52
Fig.49-2 52
Fig.49-3 52
ALL DELETE 53
ALL DELETEDELETE 54
17. GENERAL 56
18. BATTERY REPLACEMENT 57
19. FUSE REPLACEMENT 57
20. SERVICING 58

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Kyoritsu 6016 Manual do Utilizador Página 41

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